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Structure and optical properties of polycrystalline Cd1−xZnxTe thin films prepared by simultaneous evaporation

✍ Scribed by Ye Shao; Jia-Gui zheng; Jing-Quan Zhang; Liang-Huan Feng; Dao-Ling Cai; Wei Cai; Li-Li Wu; Ya-Ping Cai; Bing Li; Wei Li; Wen-Jian Leng

Book ID
110345739
Publisher
Springer US
Year
2002
Tongue
English
Weight
290 KB
Volume
13
Category
Article
ISSN
0957-4522

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Optical Constants of Polycrystalline Cd1
Optical Constants of Polycrystalline Cd1−xZnxTe Thin Films by Spectroscopic Ellipsometry
✍ K. Prasada Rao; O. Md. Hussain; B. Srinivasulu Naidu; P. Jayarama Reddy 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 127 KB 👁 2 views

Spectroscopic ellipsometry has been used to determine the optical constants-complex dielectric constant (e\* = e 1 + e 2 ), refractive index (n), extinction coefficient (k), absorption coefficient (a) and normal incidence reflectivity (R)-of two-source vacuum-evaporated polycrystalline Cd 1 Àx Zn x