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Mapping of residual stresses around an indentation in β-Si3N4 using Raman spectroscopy

✍ Scribed by N Muraki; G Katagiri; V Sergo; G Pezzotti; T Nishida


Book ID
110373622
Publisher
Springer
Year
1997
Tongue
English
Weight
514 KB
Volume
32
Category
Article
ISSN
0022-2461

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