𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Raman Analysis of Microscopic Residual Stresses Stored in the Secondary Phase of Sc2O3-Doped Si3N4

✍ Scribed by Tochino, Shigemi; Pezzotti, Giuseppe


Book ID
121337416
Publisher
Trans Tech Publications, Ltd.
Year
2005
Tongue
English
Weight
395 KB
Volume
287
Category
Article
ISSN
1662-9795

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES