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Macrochannelling: Characterisation of nano-structures by ion beam analysis

โœ Scribed by Leon van Dijk; Murat Bozkurt; Andrew Alves; Peter N. Johnston; Tim J. Davis; Patrick Reichart; David N. Jamieson


Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
235 KB
Volume
231
Category
Article
ISSN
0168-583X

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โœ Jian Li; Carl Rau ๐Ÿ“‚ Article ๐Ÿ“… 2005 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 349 KB

Scanning ion microscopy with polarization analysis (SIMPA) is used to study the spin-resolved surface magnetic structure of nano-sized magnetic systems. SIMPA is utilized for in situ topographic and spin-resolved magnetic domain imaging as well as for focused ion beam (FIB) etching of desired struct