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Luminescence and EPR studies of defects in Si-SiO 2 films

✍ Scribed by Baran, M.; Bulakh, B.; Korsunska, N.; Khomenkova, L.; Jedrzejewski, J.

Book ID: 118149952
Publisher: EDP Sciences
Year: 2004
Tongue: English
Weight: 103 KB
Volume: 27
Category: Article
ISSN: 1286-0042
DOI: 10.1051/epjap:2004089

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