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Low temperature characterization of effective mobility in uniaxially and biaxially strained nMOSFETs

✍ Scribed by F. Lime; F. Andrieu; J. Derix; G. Ghibaudo; F. Boeuf; T. Skotnicki

Book ID: 108269543
Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 191 KB
Volume: 50
Category: Article
ISSN: 0038-1101
DOI: 10.1016/j.sse.2006.03.036

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