✦ LIBER ✦
Effect of strain on the electron effective mobility in biaxially strained silicon inversion layers: An experimental and theoretical analysis via atomic force microscopy measurements and Kubo-Greenwood mobility calculations
✍ Scribed by Bonno, Olivier; Barraud, Sylvain; Mariolle, Denis; Andrieu, François
- Book ID
- 119959844
- Publisher
- American Institute of Physics
- Year
- 2008
- Tongue
- English
- Weight
- 570 KB
- Volume
- 103
- Category
- Article
- ISSN
- 0021-8979
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