✦ LIBER ✦
Temperature dependence of enhanced hole mobility in uniaxial strained p-channel metal-oxide-semiconductor field-effect transistors and insight into the physical mechanisms
✍ Scribed by Yang, Xiaodong; Parthasarathy, Srivatsan; Sun, Yongke; Koehler, Andrew; Nishida, Toshikazu; Thompson, Scott E.
- Book ID
- 118200570
- Publisher
- American Institute of Physics
- Year
- 2008
- Tongue
- English
- Weight
- 615 KB
- Volume
- 93
- Category
- Article
- ISSN
- 0003-6951
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