𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Low frequency gate noise in a diode-connected MESFET: measurements and modeling

✍ Scribed by Lambert, B.; Malbert, N.; Verdier, F.; Labat, N.; Touboul, A.; Vandamme, L.K.J.


Book ID
114538614
Publisher
IEEE
Year
2001
Tongue
English
Weight
117 KB
Volume
48
Category
Article
ISSN
0018-9383

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES