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Low-Field Electron Mobility Model for Ultrathin-Body SOI and Double-Gate MOSFETs With Extremely Small Silicon Thicknesses

✍ Scribed by Reggiani, S..; Gnani, E..; Gnudi, A..; Rudan, M..; Baccarani, G..


Book ID
114618884
Publisher
IEEE
Year
2007
Tongue
English
Weight
342 KB
Volume
54
Category
Article
ISSN
0018-9383

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