Low energy electron beam induced damage on InGaN/GaN quantum well structure

✍ Scribed by Nykänen, H.; Mattila, P.; Suihkonen, S.; Riikonen, J.; Quillet, E.; Homeyer, E.; Bellessa, J.; Sopanen, M.

• Book ID: 120432113
• Publisher: American Institute of Physics
• Year: 2011
• Tongue: English
• Weight: 471 KB
• Volume: 109
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.3574655