✦ LIBER ✦

Low-energy electron attachment to SF[sub 6]. I. Kinetic modeling of nondissociative attachment

✍ Scribed by Troe, Jürgen; Miller, Thomas M.; Viggiano, Albert A.

Book ID: 118749722
Publisher: American Institute of Physics
Year: 2007
Tongue: English
Weight: 788 KB
Volume: 127
Category: Article
ISSN: 0021-9606
DOI: 10.1063/1.2804761

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Low-energy electron attachment to SF[sub

Low-energy electron attachment to SF[sub 6]. II. Temperature and pressure dependences of dissociative attachment

✍ Troe, Jürgen; Miller, Thomas M.; Viggiano, Albert A. 📂 Article 📅 2007 🏛 American Institute of Physics 🌐 English ⚖ 861 KB

Low-energy electron attachment to SF[sub

Low-energy electron attachment to SF[sub 6]. III. From thermal detachment to the electron affinity of SF[sub 6]

✍ Viggiano, Albert A.; Miller, Thomas M.; Friedman, Jeffrey F.; Troe, Jürgen 📂 Article 📅 2007 🏛 American Institute of Physics 🌐 English ⚖ 502 KB

Nondissociative low-energy electron atta

Nondissociative low-energy electron attachment to SF[sub 6], C[sub 6]F[sub 6], C[sub 10]F[sub 8], and c-C[sub 7]F[sub 14]: Negative ion lifetimes

✍ Suess, L.; Parthasarathy, R.; Dunning, F. B. 📂 Article 📅 2002 🏛 American Institute of Physics 🌐 English ⚖ 382 KB

Kinetics and thermochemistry of electron

Kinetics and thermochemistry of electron attachment to SF6

✍ Shawn P. Heneghan; Sidney W. Benson 📂 Article 📅 1983 🏛 John Wiley and Sons 🌐 English ⚖ 442 KB

Thermochemical analysis of the electron capture process of SFs leads to a rate constant for the reverse process SF; 2 SF6 + e-, k 2 = 1.5 X 1013-31'.4/H s-l, where 0 = 2.303RT, in kcal/mol. The electron affinity of 32 f 3 kcal/mol is deduced from the observed bimolecularity of the capture process do

Electron attachment to sulphur hexafluor

Electron attachment to sulphur hexafluoride: Formation of stable SF6− at low pressure

✍ Michael S. Foster; J.L. Beauchamp 📂 Article 📅 1975 🏛 Elsevier Science 🌐 English ⚖ 509 KB

EkCt~on attachment to SF6 hss been Stidicd at low prcs;urc in the 8s phk by ion cyclotron resomnce (ICR) spec-'tioscopy. Formation of stable SF; tinder cbllision-free conditions is rationdzed on the basis of radiative relaxaticn by (SF;!\*. The utility of ICR for inve$gatin~ electron attaclment at e

Experimental studies of cold electron at

Experimental studies of cold electron attachment to SF[sub 6], CF[sub 3]Br, and CCl[sub 2]F[sub 2]

✍ Le Garrec, J. L.; Sidko, O.; Queffelec, J. L.; Hamon, S.; Mitchell, J. B. A.; Ro 📂 Article 📅 1997 🏛 American Institute of Physics 🌐 English ⚖ 463 KB