Combination of specular and off-specular
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de BernabΓ©, A.; CapitΓ‘n, M. J.; Fischer, H. E.; QuirΓ³s, C.; Prieto, C.; Colino,
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Article
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1999
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John Wiley and Sons
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English
β 175 KB
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The use of resonant low-angle x-ray di β raction, combining specular and o β -specular scans, has been used to characterize accurately and self-consistently a set of magnetron-sputtered Co/Cu multilayers. This study has permitted their mesoscopic structure and quality of interfaces to be determined. M