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X-ray diffraction from fatty-acid multilayers. Significance of intensity data in low-angle diffraction

✍ Scribed by Lesslauer, W.

Book ID
117859032
Publisher
International Union of Crystallography
Year
1974
Weight
816 KB
Volume
30
Category
Article
ISSN
0567-7408

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The use of resonant low-angle x-ray di †raction, combining specular and o †-specular scans, has been used to characterize accurately and self-consistently a set of magnetron-sputtered Co/Cu multilayers. This study has permitted their mesoscopic structure and quality of interfaces to be determined. M