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Loss of material from TiSi2 films during annealing in hydrogen

โœ Scribed by A. Steffen; J. Korec; M. Maier; P. Balk


Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
395 KB
Volume
130
Category
Article
ISSN
0040-6090

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Defect evolution of nanocrystalline SnO2
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The microstructural defects of nanocrystalline SnO 2 thin films prepared by pulsed laser deposition have been investigated using transmission electron microscopy, high-resolution transmission electron microscopy and Raman spectroscopy. Defects inside nanocrystalline SnO 2 thin films could be signifi