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Long range migration of niobium during the anodic oxidation of tantalum on niobium and aluminum on niobium duplex layers

✍ Scribed by S. Rigo; J. Siejka

Publisher: Elsevier Science
Year: 1974
Tongue: English
Weight: 500 KB
Volume: 15
Category: Article
ISSN: 0038-1098
DOI: 10.1016/0038-1098(74)90753-4

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