๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Local structural investigation of silicon surfaces by electron scattering

โœ Scribed by M. De Crescenzi; R. Gunnella; P. Castrucci; I. Davoli


Publisher
Italian Physical Society
Year
1998
Tongue
English
Weight
544 KB
Volume
20
Category
Article
ISSN
0392-6737

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


The local structure of porous silicon in
โœ G. Dalba; P. Fornasini; M. Grazioli; R. Grisenti; Y. Soldo; F. Rocca ๐Ÿ“‚ Article ๐Ÿ“… 1995 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 175 KB

X-ray absorption measurements at the K-edge of silicon have been done in transmission mode on three powdered samples of porous silicon (p-Si) with 50%, 65% and 80% porosity, prepared by decreasing the HF content in the anodic solution. The analysis of EXAFS reveals a crystal-like structure of p-Si a