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Local microstructure of Ge layers buried in a silicon crystal studied by extended X-ray absorption fine structure

✍ Scribed by I.N. Demchenko; K. Lawniczak-Jablonska; K.S. Zhuravlev; E. Piskorska; A.I. Nikiforov; E. Welter

Book ID: 117622130
Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 171 KB
Volume: 362
Category: Article
ISSN: 0925-8388
DOI: 10.1016/s0925-8388(03)00577-2

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