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Phosphorus-doped silicon nanowires studied by near edge x-ray absorption fine structure spectroscopy

✍ Scribed by Tang, Y. H.; Sham, T. K.; Jürgensen, A.; Hu, Y. F.; Lee, C. S.; Lee, S. T.

Book ID: 127125935
Publisher: American Institute of Physics
Year: 2002
Tongue: English
Weight: 473 KB
Volume: 80
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.1478796

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