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“Inverted hut” structure of Si–Ge nanocrystals studied by extended x-ray absorption fine structure method

✍ Scribed by Soo, Y. L.; Kioseoglou, G.; Huang, S.; Kim, S.; Kao, Y. H.; Peng, Y. H.; Cheng, H. H.


Book ID
120834690
Publisher
American Institute of Physics
Year
2001
Tongue
English
Weight
364 KB
Volume
78
Category
Article
ISSN
0003-6951

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