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Local atomic structure at thermally grown Si/SiO2 interfaces

✍ Scribed by J.T. Fitch; C.H. Bjorkman; G. Lucovsky; F.H. Pollak; X. Yin


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
461 KB
Volume
39
Category
Article
ISSN
0169-4332

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