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Carrier recombination velocities at the SiO2/Si interface investigated by a photo-thermal reflection microscopy

✍ Scribed by T. Ikari; A. Fukuyama; T. Murata; M. Suemitsu; N. Haddad; V. Reita; J.P. Roger; D. Fournier


Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
239 KB
Volume
124-125
Category
Article
ISSN
0921-5107

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