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Limits of low noise performance of detector readout front ends in CMOS technology

✍ Scribed by Sansen, W.M.C.; Chang, Z.Y.

Book ID: 114560038
Publisher: IEEE
Year: 1990
Weight: 806 KB
Volume: 37
Category: Article
ISSN: 0098-4094
DOI: 10.1109/31.62412

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