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Lifetime measurements on Ge wafers for Ge/GaAs solar cells — chemical surface passivation

✍ Scribed by A. Blondeel; P. Clauws; B. Depuydt

Book ID
104420467
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
114 KB
Volume
4
Category
Article
ISSN
1369-8001

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A novel, easily applicable surface passivation technique is presented, which, in combination with contactless photocoductance decay (PCD) measurements, allows a quick estimation of the bulk carrier lifetime of crystalline silicon wafers. The proposed passivation technique requires neither a chemical