𝔖 Bobbio Scriptorium

✦ LIBER ✦

Leakage Power Reduction Techniques in Deep Submicron Technologies for VLSI Applications

✍ Scribed by M.Geetha Priya; K. Baskaran; D. Krishnaveni

Book ID: 119357444
Publisher: Elsevier
Year: 2012
Tongue: English
Weight: 461 KB
Volume: 30
Category: Article
ISSN: 1877-7058
DOI: 10.1016/j.proeng.2012.01.976

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Standby Leakage Power Reduction Techniqu

Standby Leakage Power Reduction Technique for Nanoscale CMOS VLSI Systems

✍ HeungJun Jeon; Yong-Bin Kim; Minsu Choi 📂 Article 📅 2010 🏛 IEEE 🌐 English ⚖ 869 KB

Radiation tolerant VLSI circuits in stan

Radiation tolerant VLSI circuits in standard deep submicron CMOS technologies for the LHC experiments: practical design aspects

✍ Anelli, G.; Campbell, M.; Delmastro, M.; Faccio, F.; Floria, S.; Giraldo, A.; He 📂 Article 📅 1999 🏛 IEEE 🌐 English ⚖ 517 KB

[IEEE Computer Society IEEE Computer Soc

[IEEE Computer Society IEEE Computer Society Workshop on VLSI 2001. Emerging Technologies for VLSI Systems - Orlando, FL, USA (19-20 April 2001)] Proceedings IEEE Computer Society Workshop on VLSI 2001. Emerging Technologies for VLSI Systems - Current sensing techniques for global interconnects in very deep submicron (VDSM) CMOS

✍ Maheshwari, A.; Burleson, W. 📂 Article 📅 2001 🏛 IEEE Computer Society 🌐 English ⚖ 360 KB

Channel engineering for analog device de

Channel engineering for analog device design in deep submicron CMOS technology for system on chip applications

✍ Deshpande, H.V.; Baohong Cheng; Woo, J.C.S. 📂 Article 📅 2002 🏛 IEEE 🌐 English ⚖ 313 KB

[IEEE Comput. Soc . 17th International C

[IEEE Comput. Soc . 17th International Conference on VLSI Design - Mumbai, India (5-9 Jan. 2004)] 17th International Conference on VLSI Design. Proceedings. - A new technique for leakage reduction in CMOS circuits using self-controlled stacked transistors

✍ Hanchate, N.; Ranganathan, N. 📂 Article 📅 2004 🏛 IEEE Comput. Soc 🌐 English ⚖ 317 KB

[IEEE Power Electronics Specialist Confe

[IEEE Power Electronics Specialist Conference - PESC'98 - Fukuoka, Japan (17-22 May 1998)] PESC 98 Record. 29th Annual IEEE Power Electronics Specialists Conference (Cat. No.98CH36196) - Study of leakage current reduction techniques and their suitability for three level high power inverter applications

✍ Ratnayake, K.R.M.N.; Murai, Y. 📂 Article 📅 1998 🏛 IEEE ⚖ 531 KB