Radiation tolerant VLSI circuits in standard deep submicron CMOS technologies for the LHC experiments: practical design aspects

✍ Scribed by Anelli, G.; Campbell, M.; Delmastro, M.; Faccio, F.; Floria, S.; Giraldo, A.; Heijne, E.; Jarron, P.; Kloukinas, K.; Marchioro, A.; Moreira, P.; Snoeys, W.

• Book ID: 117998734
• Publisher: IEEE
• Year: 1999
• Tongue: English
• Weight: 517 KB
• Volume: 46
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/23.819140