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Leakage current mechanism in sub-micron polysilicon thin-film transistors

✍ Scribed by Olasupo, K.R.; Hatalis, M.K.

Book ID: 114536511
Publisher: IEEE
Year: 1996
Tongue: English
Weight: 525 KB
Volume: 43
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.506772

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