X-ray diffraction spot mapping - a tool
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Zeimer, U. ;Grenzer, J. ;Korn, D. ;Döring, S. ;Zorn, M. ;Pittroff, W. ;Pietsch,
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Article
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2007
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John Wiley and Sons
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English
⚖ 397 KB
## Abstract Local lattice plane curvature of semiconductor disk laser devices is determined by an X‐ray spot mapping technique using white beam synchrotron radiation. This method allows for in‐situ studies of the dependence of the lattice plane profile on device temperature and local heating by opt