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Laser light spot mapping of depletion in power semiconductor devices

✍ Scribed by Lindsay, S. M.


Publisher
John Wiley and Sons
Year
1979
Tongue
English
Weight
727 KB
Volume
53
Category
Article
ISSN
0031-8965

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## Abstract Local lattice plane curvature of semiconductor disk laser devices is determined by an X‐ray spot mapping technique using white beam synchrotron radiation. This method allows for in‐situ studies of the dependence of the lattice plane profile on device temperature and local heating by opt