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Quantification of thermoreflectance temperature measurements in high-power semiconductor devices—lasers and laser bars

✍ Scribed by K. Pierściński; D. Pierścińska; M. Bugajski

Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 546 KB
Volume: 40
Category: Article
ISSN: 0026-2692
DOI: 10.1016/j.mejo.2008.05.003

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