## Abstract This paper reports an investigation of the large magnetoresistance (MR) of 0.3โ1.5 ยตm thick polycrystalline Bi films deposited in vacuum on nonโcrystalline substrates and annealed at critical temperatures. The occurrence of critical temperatures is associated with intensive growth of cr
โฆ LIBER โฆ
Large magnetoresistance in post-annealed polycrystalline and epitaxial Bi thin films
โ Scribed by Sunglae Cho; Yunki Kim; L.J. Olafsen; I. Vurgaftman; A.J. Freeman; G.K.L. Wong; J.R. Meyer; C.A. Hoffman; J.B. Ketterson
- Book ID
- 114224964
- Publisher
- Elsevier Science
- Year
- 2002
- Tongue
- English
- Weight
- 104 KB
- Volume
- 239
- Category
- Article
- ISSN
- 0304-8853
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