Large magnetoresistance in postannealed Bi thin films
โ Scribed by Cho, Sunglae; Kim, Yunki; Freeman, A. J.; Wong, G. K. L.; Ketterson, J. B.; Olafsen, L. J.; Vurgaftman, I.; Meyer, J. R.; Hoffman, C. A.
- Book ID
- 111653438
- Publisher
- American Institute of Physics
- Year
- 2001
- Tongue
- English
- Weight
- 314 KB
- Volume
- 79
- Category
- Article
- ISSN
- 0003-6951
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## Abstract This paper reports an investigation of the large magnetoresistance (MR) of 0.3โ1.5 ยตm thick polycrystalline Bi films deposited in vacuum on nonโcrystalline substrates and annealed at critical temperatures. The occurrence of critical temperatures is associated with intensive growth of cr
## Abstract Substantial influence of uniaxial stretch __S__ and compression __P__ on resistivity __ฯ__ and magnetoresistance (MR) of highโquality polycrystalline Bi films consisting of up to 200 ฮผm length crystallites was observed. The investigated 1.5 ฮผm thick films were deposited on nonโcrystalli