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X-ray microdiffraction: local stress distributions in polycrystalline and epitaxial thin films

✍ Scribed by M.A Phillips; R Spolenak; N Tamura; W.L Brown; A.A MacDowell; R.S Celestre; H.A Padmore; B.W Batterman; E Arzt; J.R Patel

Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 635 KB
Volume: 75
Category: Article
ISSN: 0167-9317
DOI: 10.1016/j.mee.2003.12.053

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