X-Ray Diffraction and Conductivity Studies in Polycrystalline Thin Films of CuInTe2 with Excess Copper Content

✍ Scribed by Sethi, B. R. ;Dashtiani, M. ;Sharma, O. P. ;Mathur, P. C.

• Publisher: John Wiley and Sons
• Year: 1992
• Tongue: English
• Weight: 337 KB
• Volume: 134
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2211340113