✦ LIBER ✦

Journées d'electronique 1983—Testing complex integrated circuits

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Guest Editorial: Special Issue on Testin

✍ Erik Jan Marinissen; Yervant Zorian 📂 Article 📅 2012 🏛 Springer US 🌐 English ⚖ 77 KB

Testing of TSV-Induced Small Delay Fault

✍ Kuo, Chun-Yi; Shih, Chi-Jih; Lu, Yi-Chang; Li, James Chien-Mo; Chakrabarty, Kris 📂 Article 📅 2014 🏛 IEEE 🌐 English ⚖ 639 KB

Automated board testing: coping with com

📂 Article 📅 1984 🏛 Elsevier Science 🌐 English ⚖ 90 KB

Failure physics of integrated circuits—a

📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 79 KB

back surface inversion play important roles in controlling leakage in SOS devices. A strategy for rule verification shrinks LSI layouts

Failure physics of integrated circuits—a

📂 Article 📅 1984 🏛 Elsevier Science 🌐 English ⚖ 120 KB

Assessment of micropackaged integrated c

📂 Article 📅 1984 🏛 Elsevier Science 🌐 English ⚖ 134 KB