Failure physics of integrated circuits—a review: N. D. Stojadinovic Microelectron. Reliab. 23 (4), 609 (1983)

• Book ID: 104157439
• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 79 KB
• Volume: 17
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(86)80048-9

✦ Synopsis

back surface inversion play important roles in controlling leakage in SOS devices.

A strategy for rule verification shrinks LSI layouts