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[Japan Soc. Promotion of Sci International Vacuum Microelectronics Conference - Osaka, Japan (7-11 July 2003)] IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) - Experimental observation of ultra-high field emission current from single carbon nanotube emitter

✍ Scribed by She, J.C.; Xu, N.S.; Deng, S.Z.; Jun Chen, ; Bishop, H.; Huq, S.E.; Wang, L.; Zhong, D.Y.; Wang, E.G.

Book ID: 121296863
Publisher: Japan Soc. Promotion of Sci
Year: 2003
Weight: 124 KB
Category: Article
ISBN-13: 9784818195158
DOI: 10.1109/IVMC.2003.1223067

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