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[Japan Soc. Promotion of Sci International Vacuum Microelectronics Conference - Osaka, Japan (7-11 July 2003)] IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) - Theoretical investigation of current-voltage characteristics between closely spaced metals

✍ Scribed by Il'chenko, L.G.; Il'chenko, V.V.; Novosad, R.M.

Book ID: 120007875
Publisher: Japan Soc. Promotion of Sci
Year: 2003
Weight: 109 KB
Category: Article
ISBN-13: 9784818195158
DOI: 10.1109/IVMC.2003.1223055

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