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[Japan Soc. Promotion of Sci International Vacuum Microelectronics Conference - Osaka, Japan (7-11 July 2003)] IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) - Investigation of gated micro-sized electron sources with CNT field emitters

✍ Scribed by Knapp, W.; Schleussner, D.

Book ID: 121008084
Publisher: Japan Soc. Promotion of Sci
Year: 2003
Weight: 127 KB
Category: Article
ISBN-13: 9784818195158
DOI: 10.1109/IVMC.2003.1223079

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