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[Japan Soc. Appl. Phys 1999 Symposium on VLSI Technology. Digest of Technical Papers - Kyoto, Japan (14-16 June 1999)] 1999 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.99CH36325) - Submicron CMOS thermal noise modeling from an RF perspective

✍ Scribed by Ou, J.J.; Xiaodong Jin, ; Chenming Hu, ; Gray, P.R.

Book ID: 126171745
Publisher: Japan Soc. Appl. Phys
Year: 1999
Tongue: Japanese
Weight: 141 KB
Category: Article
ISBN-13: 9784930813930
DOI: 10.1109/VLSIT.1999.799388

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