IVa-6 studies of Si/SiO2interfaces by Auger sputter profiling and photoelectron spectroscopy using synchrotron radiation

✍ Scribed by Halms, C.R.; Garner, C.M.; Miller, J.; Lindau, I.; Schwarz, S.; Spicer, W.E.

• Book ID: 114592561
• Publisher: IEEE
• Year: 1977
• Tongue: English
• Weight: 144 KB
• Volume: 24
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1977.18955