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Preparation of ZrO2on flat, conducting SiO2/Si(100) model supports by wet chemical techniques; X-ray photoelectron spectroscopy and Auger depth profiling

✍ Scribed by L. M. Eshelman; A. M. Jong; J. W. Niemantsverdriet


Book ID
112405057
Publisher
Springer US
Year
1991
Tongue
English
Weight
540 KB
Volume
10
Category
Article
ISSN
1011-372X

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