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Isochromat spectroscopy using SXAPS equipment

โœ Scribed by Conrad, M. ;Dose, V. ;Fauster, Th. ;Scheidt, H.


Book ID
104998813
Publisher
Springer
Year
1979
Tongue
English
Weight
356 KB
Volume
20
Category
Article
ISSN
1432-0630

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Electronic-structure study of Ni3Al, Ni3
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The electronic structures of Ni 3 Al, Ni 3 Ga, Ni 3 In, and NiGa were studied by high-resolution X-ray photoemission spectroscopy (XPS) and Bremsstrahlung isochromat spectroscopy (BIS). The XPS valence-band and BIS spectra of Ni 3 Al and Ni 3 Ga agree well with available density-of-states (DOS) curv