X-ray absorption spectra of Si, SiO and SiOt in the Si K edge region are presented. They reveal a strong influence of the type of silicon bond on the structure of the absorption spectra situated towards high energies of the edge. These spectra show that the SiO oxide cannot be taken as a mixture of
Iron nanoparticles in amorphous SiO2: X-ray emission and absorption spectra
✍ Scribed by É. Z. Kurmaev; D. A. Zatsepin; S. O. Cholakh; B. Schmidt; Y. Harada; T. Tokushima; H. Osawa; S. Shin; T. Takeuchi
- Book ID
- 110141790
- Publisher
- SP MAIK Nauka/Interperiodica
- Year
- 2005
- Tongue
- English
- Weight
- 59 KB
- Volume
- 47
- Category
- Article
- ISSN
- 1063-7834
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