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Ion beams as analytical tools in the thermal growth of ultrathin silicon oxide films

✍ Scribed by E.B.O. da Rosa; S. Gonçalves; R.M.C. de Almeida; I.J.R. Baumvol; F.C. Stedile

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A molecular dynamics simulation of ultra

✍ Kubota, A.; Economou, D.J. 📂 Article 📅 1999 🏛 IEEE 🌐 English ⚖ 450 KB

Stress field in sputtered thin films: Io

✍ Debelle, A.; Abadias, G.; Michel, A.; Jaouen, C. 📂 Article 📅 2004 🏛 American Institute of Physics 🌐 English ⚖ 410 KB