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Ion-beam induced defects and nanoscale amorphous clusters in silicon carbide

✍ Scribed by W.J Weber; F Gao; R Devanathan; W Jiang; C.M Wang


Book ID
113822663
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
577 KB
Volume
216
Category
Article
ISSN
0168-583X

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