Ion beam characterization and engineering of strain in semiconductor multi-layers

✍ Scribed by S.V.S Nageswara Rao; Anand P Pathak; Azher M Siddiqui; D.K Avasthi; Claudiu Muntele; Daryush Ila; B.N Dev; R Muralidharan; F Eichhorn; R Groetzschel; A Turos

• Book ID: 114167752
• Publisher: Elsevier Science
• Year: 2003
• Tongue: English
• Weight: 486 KB
• Volume: 212
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/s0168-583x(03)01719-1