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Investigations on electrical characteristics and reliability properties of MOS capacitors using HfAlOx on n-GaAs substrates

✍ Scribed by P.S. Das; Abhijit Biswas

Book ID: 113800592
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 620 KB
Volume: 52
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2011.08.005

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