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Effects of 6 MeV electron irradiation on the electrical properties and device parameters of Al/Al2O3/TiO2/n-Si MOS capacitors

✍ Scribed by P. Laha; I. Banerjee; P.K. Barhai; A.K. Das; V.N. Bhoraskar; S.K. Mahapatra

No coin nor oath required. For personal study only.

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Effects of 6&#xa0;MeV electron irradiation on the electrical properties and device parameters of Al/Al2O3/TiO2/n-Si MOS capacitors