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Investigation on dispersion of optical constants of Gd2O3 films by phase modulated spectroscopic ellipsometry

✍ Scribed by D. Bhattacharyya; A. Biswas; N.K. Sahoo


Book ID
103815917
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
218 KB
Volume
233
Category
Article
ISSN
0169-4332

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Optical Constants of Polycrystalline Cd1
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Spectroscopic ellipsometry has been used to determine the optical constants-complex dielectric constant (e\* = e 1 + e 2 ), refractive index (n), extinction coefficient (k), absorption coefficient (a) and normal incidence reflectivity (R)-of two-source vacuum-evaporated polycrystalline Cd 1 Γ€x Zn x