Investigation of thermal sensitivity and radiation resistance of SiOx〈Ti〉 metal-dielectric films

✍ Scribed by Shepeliavyi, P.E.; Indutnyi, I.Z.; Dan’ko, V.A.; Neimash, V.B.; Povarchuk, V.Yu.

• Book ID: 122139460
• Publisher: Elsevier Science
• Year: 2014
• Tongue: English
• Weight: 480 KB
• Volume: 63
• Category: Article
• ISSN: 1350-4495
• DOI: 10.1016/j.infrared.2014.01.006